Incident and transmitted light microscopes Panthera TEC MAT

Incident and transmitted light microscopes for science materials, inspection of semiconductor components, LCD displays and wafers, equipped with an intelligent brightfield / darkfield illumination concept. The microscope models with additionally integrated LED transmitted light expand the application options in the direction of complex composite materials.

• Tube type Siedentopf, swiveling
• Widefield oculars for spectacle wearers with diopter adjustment on both oculars
• CCIS^® Plan Achromat & S-APO (PB free), DIN objectives
• Reversed coded nosepiece
• LED incident light illuminator with field and aperture diaphragm, with slots for polariser / analyser sliders
• With interchangeable illumination
• Motic LightTracer: Light memory, sleep mode (auto on-off), nosepiece LED light intensity and mode indicator
• Coaxial coarse and fine focusing system with tension adjustment
• Integrated power supply with sleep mode
• USB 2.0 for external camera power

Additional equipment depending on the model with bright field (transmitted light), segmentable dark field (reflected light), polarization (reflected light)

Scope of supply: Dust cover, power cord, allen key, screws for metal extension support